You are now in the main content area

Digital Circuit Testing

This course presents an introduction to failures and faults in digital circuits. Other topics include the modelling of various types of faults: single and multiple stuck-at-faults, delay faults and bridging faults, test generation techniques for combinational and sequential circuits, fault simulation algorithms, design for testability (DFT), and built-in-self-test (BIST). PREREQ: COSC 3426. (lec 3) cr 3.

Mathematics & Computer Science